Features:
1.Provide lighting evenly from top.
2.Provide shadowless illumination from the four angles.
3.Ability to evenly diffused inspection and provide shadowless lighting.
4.Best choice of square inspection objectives.

Major Applications:
1.IC wafer inspection & substrate part inspection
2.Inspection from the side and to emerge from internal surfaces of object for stain
3.Visual inspection of wafers
4.Solder inspection & connector pitch inspection
I agree